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碲化锡 Sb2Te3

简要描述:Powder X-ray diffraction (XRD) of a single crystal Sb2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

  • 更新时间:2024-06-03
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详细介绍

晶体尺寸:10毫米
电学性能:半导体,拓扑绝缘体,热电性
晶体结构:六边形
晶胞参数:a = b = 0.425nm,C = 3.048nm,α=β= 90°γ= 120
晶体类型:合成
晶体纯度:>99.995%
表征方法:XRD、拉曼、EDX


X-ray diffraction on a Sb2Te3 single crystal aligned along the (001) plane. XRD was performed at room temperature using a D8 Venture Bruker. The 7 XRD peaks correspond, from left to right, to (00l) with l = 6, 9, 12, 15, 18, 21, 24



Powder X-ray diffraction (XRD) of a single crystal Sb2Te3. X-ray diffraction was performed at room temperature using a D8 Venture Bruker.

Stoichiometric analysis of a single crystal Sb2Te3 by Energy-dispersive X-ray spectroscopy (EDX).


Raman spectrum of a single crystal Sb2Te3. Measurement was performed with a 785 nm Raman system at room temperature.


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